• 【Dual Card Simultaneous Testing】Test two SIM card signals and network status simultaneously with a single insertion, dramatically reducing testing time for efficient diagnostics.

• 【No Disassembly Required】Compact and lightweight design allows direct insertion into devices without removing phone cases or card trays for quick fault detection.

• 【Universal Compatibility】Compatible with iPhone series dual SIM models and mainstream Android phones, meeting diverse repair scenarios for professional technicians.

• 【Dedicated NM Card Support】Specially designed for HW series phones with accurate NM memory card identification to quickly determine card slot or card body faults.

• 【Multi-Slot Coverage】Integrated testing function for SIM1, SIM2, TF cards, and NM cards, solving common storage recognition issues across different card specifications.

Specifications:

• Model: XA6
• Main Board Dimensions: 124mm x 107mm
• Center Disc Diameter: 13.5mm
• NM Test Module Dimensions: 42.3mm x 9.6mm x 14.2mm
• Material: FR-4 PCB with Blue Solder Mask, Metal Card Slots with Silver Plating
• Supported Card Types: Nano-SIM (SIM1/SIM2), Micro-SIM, TF Card, NM Card
• Testing Method: Plug and Play