• 【Specifically Designed for 16e Motherboards】Custom-built for iPhone 16e mainboards to ensure accurate diagnostics and easier repair
• 【Gold-Plated Probe】High-precision, corrosion-resistant probes ensure stable signal transmission and long-lasting performance
• 【Accurate Positioning & Free Frame Testing】One-piece design with precise alignment—supports direct testing without the phone frame
• 【Lightweight and Ergonomic】Compact and portable structure offers ease of use and enhanced comfort during long repair sessions
• 【Comprehensive Function Testing】Supports boot-up, display, touch, camera, flash, speaker, Wi-Fi, and Face ID function testing—no soldering required

Specifications:

• Product name: 16e delamination test frame
• Probe type: Custom gold-plated spring probes
• Product size: 86x58x15mm
• Product N.W: 109g