• 【4-in-1 Multi-Model Support】Revolutionary testing frame supports for iPhone 17 series with a single integrated design for versatile motherboard testing.

• 【Premium Beryllium Copper Probes】Consistently uses imported beryllium copper spring probes ensuring reliable contact and superior conductivity for accurate testing results.

• 【Modular Fixture Design】Features replaceable white metal fixtures with precise positioning holes and contact points for easy adaptation between different models.

• 【Professional Testing Solution】Designed for offline motherboard functionality testing in repair and production environments with flip-lock mechanisms and positioning pins.

• 【Precision Engineering】High-precision probe specifications with 6mm total length and 0.5mm center diameter ensure consistent and accurate testing performance.

Specifications:

• Testing Frame Dimensions: 131mm x 80mm x 17mm
• Probe Material: Imported Beryllium Copper
• Probe Total Length: 6mm
• Probe Center Diameter: Φ0.5mm
• Probe End Diameter: Φ0.25mm
• Probe Center Length: 3.9mm
• Probe End Lengths: 0.6mm and 1.5mm
• Fixture Material: Metal
• Structure: Flip-lock Design with Positioning Pins