• 【Precise Positioning】 Double-headed probe accurately aligns with small holes, improving contact performance for more accurate test data.
• 【Secure Fastening】 Fixed buckles prevent motherboard warping, ensuring reliable and precise measurements.
• 【Versatile Compatibility】 Designed for testing iPhone 16 series logic boards, including 16, 16 Plus, 16 Pro, and 16 Pro Max models.
• 【Efficient Testing】 Facilitates quick and comprehensive functionality testing of iPhone 16 series motherboards.
• 【Professional Tool】 Ideal for B2B clients in mobile device repair and quality control industries.

Specifications:

• Material: High-quality industrial-grade materials
• Compatibility: For iPhone 16, 16 Plus, 16 Pro, and 16 Pro Max logic boards
• Testing Type: Layered motherboard testing
• Probe Type: Double-headed for precise alignment
• Fastening Mechanism: Fixed buckles
• Application: Logic board functionality testingMotherboard Layered Test Frame 
• Industry: Mobile device repair and quality control